Your query returned 2 results.

• An Identification Strategy for Highly Corrupted Measurements in Non-Linear Transient Dynamics,
  H.M. Nguyen, O. Allix and P. Feissel
  Paper 233 from CCP: 83, ISBN 1-905088-08-6 (2006)
  
• An Inverse Identification Method from Dynamic Tests with Measurement Uncertainties,
  P. Feissel, O. Allix and P. Thévenet
  Paper 54 from CCP: 75, ISBN 0-948749-83-0 (2002)