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H. Nakamura, K. Tashiro, "Malfunctions caused by Common Cause Failures and their relation to IEC-61508", in J. Pombo, (Editor), "Proceedings of the Second International Conference on Railway Technology: Research, Development and Maintenance", Civil-Comp Press, Stirlingshire, UK, Paper 154, 2014. doi:10.4203/ccp.104.154

Keywords: common cause failure, FPGA, functional safety standard, fail safe.

Summary

The second edition of the IEC 61508:2010 standard has been in effect since April 2010 and covers those aspects to be considered when electrical/electronic /programmable electronic (E/E/PE) systems are used to carry out safety functions. This second edition cancels and replaces the first edition, as it constitutes a technical revision. The second edition of IEC 61508 defines stringent requirements for onchip redundancy. Special architectural requirements for integrated circuits (ICs) with on-chip redundancy are given in a normative annex of the standard. This requirement is being driven by emerging technologies such as Field Programmable Grid Arrays (FPGAs) and advances in Application Specific Integrated Circuits (ASICs) that are helping to drive down costs by incorporating more functionality onto a single chip. A group of techniques and measures essential for preventing the introduction of faults during the design and development of these components has been introduced in the new version of the standard. In this paper, malfunctions caused by common cause failures in ASICs and their relation to functional safety standards are discussed.

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Front Page Browse CCP CSETS CTR IJRT Other Authors Search Purchase Guide FAQ Contact us	Civil-Comp Proceedings ISSN 1759-3433 CCP: 104 PROCEEDINGS OF THE SECOND INTERNATIONAL CONFERENCE ON RAILWAY TECHNOLOGY: RESEARCH, DEVELOPMENT AND MAINTENANCE Edited by: J. Pombo Paper 154 Malfunctions caused by Common Cause Failures and their relation to IEC-61508 H. Nakamura¹ and K. Tashiro² ¹Collage of Science and Technology, Nihon University, Chiba, Japan ²NRCC of National Traffic Safety and Environment Laboratory, Tokyo, Japan doi:10.4203/ccp.104.154 purchase the full-text of this paper Full Bibliographic Reference for this paper H. Nakamura, K. Tashiro, "Malfunctions caused by Common Cause Failures and their relation to IEC-61508", in J. Pombo, (Editor), "Proceedings of the Second International Conference on Railway Technology: Research, Development and Maintenance", Civil-Comp Press, Stirlingshire, UK, Paper 154, 2014. doi:10.4203/ccp.104.154 Keywords: common cause failure, FPGA, functional safety standard, fail safe. Summary The second edition of the IEC 61508:2010 standard has been in effect since April 2010 and covers those aspects to be considered when electrical/electronic /programmable electronic (E/E/PE) systems are used to carry out safety functions. This second edition cancels and replaces the first edition, as it constitutes a technical revision. The second edition of IEC 61508 defines stringent requirements for onchip redundancy. Special architectural requirements for integrated circuits (ICs) with on-chip redundancy are given in a normative annex of the standard. This requirement is being driven by emerging technologies such as Field Programmable Grid Arrays (FPGAs) and advances in Application Specific Integrated Circuits (ASICs) that are helping to drive down costs by incorporating more functionality onto a single chip. A group of techniques and measures essential for preventing the introduction of faults during the design and development of these components has been introduced in the new version of the standard. In this paper, malfunctions caused by common cause failures in ASICs and their relation to functional safety standards are discussed. purchase the full-text of this paper (price £20) go to the previous paper go to the next paper return to the table of contents return to the book description purchase this book (price £65 +P&P)
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